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EIA CB-4:1965
New product
EIA CB-4:1965
Effect of the Wire Diameter on Wirewound Resistors ReliabilityMore info
| Author | EIA |
|---|---|
| Editor | EIA |
| Document type | Standard |
| Format | File |
| ICS | 31.040.01 : Resistors in general
|
| Number of pages | 29 |
| Year | 1960 |
| Document history | |
| Country | USA |
| Keyword | EIA 4;4;EIA CB 4 |