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EIA JEP 65:1967 (R1999)
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EIA JEP 65:1967 (R1999)
Verification of Maximum Ratings of Power Transistors, Test Procedures forMore info
This publication describes tests which are intended to represent the verification of maximum ratings for data sheets; they are not tests for performance or quality level. This material is to be used in conjunction with formats developed for device registration and defining data.
| Author | EIA |
|---|---|
| Editor | EIA |
| Document type | Standard |
| Format | File |
| Confirmation date | 1999-04-01 |
| ICS | 31.080.30 : Transistors
|
| Number of pages | 23 |
| Year | 1960 |
| Document history | |
| Country | USA |
| Keyword | EIA 65;65;EIA JEP65 |