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EIA JESD 313B:1975 (R2001)
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EIA JESD 313B:1975 (R2001)
Conduction Cooled Power Transistors, Thermal Resistance Measurements ofMore info
This standard provides a test method for measuring thermal resistance for conduction cooled power transistors.
| Author | EIA |
|---|---|
| Editor | EIA |
| Document type | Standard |
| Format | File |
| Confirmation date | 2001-04-01 |
| ICS | 31.080.30 : Transistors
|
| Number of pages | 18 |
| Year | 1970 |
| Document history | |
| Country | USA |
| Keyword | EIA 313B;313B;EIA JESD313B |