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This test is performed to determine the effect of storing or operating component parts at elevated temperatures for various time periods. Different degrees of severity as prescribed by temperature and time are available. This method should be used in conjunction with the pertinent component specification which will define severity.
Author | EIA |
---|---|
Editor | EIA |
Document type | Standard |
Format | File |
Edition | E |
ICS | 31.020 : Electronic components in general
|
Number of pages | 4 |
Year | 1970 |
Document history | |
Country | USA |
Keyword | EIA RS-186;EIA 186;EIA 186.12E;186 |