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This Standard establishes uniform methods for testing electronic component parts. In case of conflict between this Standard and any individual component standards or detail specifications, the requirements of the individual component standard or detail specification shall govern. These test methods provide a number of test conditions of varying degrees of severity so that appropriate test conditions may be selected for any component.
Author | EIA |
---|---|
Editor | EIA |
Document type | Standard |
Format | File |
Edition | E |
ICS | 31.020 : Electronic components in general
|
Number of pages | 5 |
Modified by | Includes all amendments and changes through Reaffirmation Notice , April 1983 |
Year | 1970 |
Document history | |
Country | USA |
Keyword | EIA RS-186;EIA 186;186 |