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EIA JESD 4:1983 (R2002)
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EIA JESD 4:1983 (R2002)
Definition of External Clearance and Creepage Distances of Discrete Semiconductor Packages for Thyristors and Rectifier DiodesMore info
This standard defines reference distances between terminals of the device and the external package at specific voltages.
| Author | EIA |
|---|---|
| Editor | EIA |
| Document type | Standard |
| Format | File |
| Confirmation date | 2002-04-01 |
| ICS | 31.080.10 : Diodes
31.080.20 : Thyristors |
| Number of pages | 9 |
| Year | 1980 |
| Document history | |
| Country | USA |
| Keyword | EIA 4;4;EIA JESD4 |