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EIA JESD 531:1986 (R2002)
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EIA JESD 531:1986 (R2002)
Thermal Resistance Test Method for Signal and Regulator Diodes (Forward Voltage, Switching Method)More info
This standard describes a test method for measuring the thermal resistance of signal and regulator diodes. The need for modification of this test method arose out of the limited description that existed earlier for both signal and regulator diode applications in testing for thermal resistance. Previously published as ID-13. ANSI/EIA-531-1986 (July) expired June 1996. Became JESD531 after reaffirmation April 2002.
| Author | EIA |
|---|---|
| Editor | EIA |
| Document type | Standard |
| Format | File |
| Confirmation date | 2002-04-01 |
| ICS | 31.080.10 : Diodes
|
| Number of pages | 21 |
| Replace | EIA-531 (1986) |
| Year | 1980 |
| Document history | EIA JESD 531 (1986-07) |
| Country | USA |
| Keyword | EIA 531;531;EIA JESD531 |