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EIA TEP 105-9:1987
New product
EIA TEP 105-9:1987
Line Profile Measurements in Shadow Mask and Other Structured Screen Cathode Ray TubesMore info
| Author | EIA |
|---|---|
| Editor | EIA |
| Document type | Standard |
| Format | File |
| ICS | 19.100 : Non-destructive testing
|
| Number of pages | 10 |
| Year | 1980 |
| Document history | |
| Country | USA |
| Keyword | EIA TEP 105;EIA 105;EIA 105.9;105;EIA TEP105-9 |