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EIA JESD 24-1:1989 (R2002)
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EIA JESD 24-1:1989 (R2002)
Method for Measurement of Power Device Turn-Off Switching LossMore info
Describes the method of a typical oscilloscope waveform and the basic test circuit employed in the measurement of turn off loss for bipolar, IGBT and MOSFET power semiconductors. This method can be used as a standard for evaluating power semiconductor turn-off switching loss capability and defines standard terminology that should be referenced within the electronic industry.
| Author | EIA |
|---|---|
| Editor | EIA |
| Document type | Standard |
| Format | File |
| Confirmation date | 2002-10-01 |
| ICS | 33.040.30 : Switching and signalling systems
|
| Number of pages | 16 |
| Modify | EIA JESD 24 (1985)
|
| Year | 1980 |
| Document history | |
| Country | USA |
| Keyword | EIA JESD 24;EIA 24;EIA 24.1;24;EIA JESD24-1 |