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EIA JESD 24-9:1992 (R2002)

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EIA JESD 24-9:1992 (R2002)

Short Circuit Withstand Time Test Method

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$16.19

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$36.80

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Test method to determine how long a device can survive a short circuit condition with a given drive level.

Author EIA
Editor EIA
Document type Standard
Format File
Confirmation date 2002-10-01
ICS 33.040.50 : Lines, connections and circuits
Number of pages 12
Modify EIA JESD 24 (1985)
Year 1990
Document history
Country USA
Keyword EIA JESD 24;EIA 24;EIA 24.9;24;EIA JESD24-9