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EIA/TIA-455-8:2000 (R2008)

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EIA/TIA-455-8:2000 (R2008)

FOTP-8 Measurement of Splice or Connector Loss and Reflectance Using an OTDR

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Introduction Intent This procedure describes the use of an optical time-domain reflectometer (OTDR) to indirectly measure the loss and reflectance of a splice or connector. Other methods Loss or reflectance measurements may be obtained also by using FOTP-34 or FOTP-107. The latter values will be accepted as correct in the event of a dispute. Trace defects Some OTDR/fiber combinations appear to give 'noisy' traces that may be repeatable for a given OTDR but not against other OTDRs with the same fiber. These appear to be related to polarization and coherence effects, and are being studied in FO-6.6. Some OTDR manufacturers offer noise filters, internal or external to the OTDR, and care shall be taken that these do not mask 'true' artifacts of the trace. Moreover, parts of the trace that are noisy due to low signal-to-noise ratio shall not be used.

Author EIA/TIA
Editor EIA
Document type Standard
Format File
Confirmation date 2008-04-21
ICS 33.180.10 : Fibres and cables
Number of pages 26
Cross references ANSI/TIA-455-8 (2000), IDT
Year 2000
Document history
Country USA
Keyword EIA 455;EIA 455.8;EIA/TIA 455;EIA/TIA-455;455;TIA/EIA-455-8;EIA TIA-455-8