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EIA-364-107:2000 (R2013)

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EIA-364-107:2000 (R2013)

TP-107 Eye Pattern and Jitter Test Procedure for Electrical Connectors, Sockets, Cable Assemblies or Interconnection Systems

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This procedure is applicable to electrical connectors, cable assemblies, or interconnection systems.

Author EIA
Editor EIA
Document type Standard
Format File
Confirmation date 2013-01-01
ICS 29.120.20 : Connecting devices
29.120.30 : Plugs, socket-outlets, couplers
Number of pages 22
Cross references ANSI/EIA-364-107 (2000), IDT
Year 2000
Document history
Country USA
Keyword EIA 364;EIA 364.107;EIA-364;364