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This standard covers the design of printed circuit boards (PCBs) used in the thermal characterization of Dual-Inline Packages (DIP) and Single-Inline Packages (SIP). It is intended to be used in conjunction with the JESD51 series of standards that cover the test methods and test environments. JESD51-10 was developed to give a figure-of-merit of thermal performance that allows for accurate comparisons of packages from different suppliers. It can be used to give a first order approximation of system performance and, in conjunction with the other JESD51 PCB standards, allows for comparisons of the various package families.
Author | EIA |
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Editor | EIA |
Document type | Standard |
Format | File |
ICS | 17.200.01 : Thermodynamics in general
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Number of pages | 18 |
Year | 2000 |
Document history | |
Country | USA |
Keyword | EIA JESD 51;EIA 51;EIA 51.10;51;EIA JESD51-10 |