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EIA JESD 85:2001 (R2014)
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EIA JESD 85:2001 (R2014)
Methods for Calculating Failure Rates in Units of FITsMore info
This standard establishes methods for calculating failure rates in units of FITs by using data in varying degrees of detail such that results can be obtained from almost any data set. The objective is to provide a reference to the way failure rates are calculated.
| Author | EIA |
|---|---|
| Editor | EIA |
| Document type | Standard |
| Format | File |
| Confirmation date | 2014-01-01 |
| ICS | 31.200 : Integrated circuits. Microelectronics
|
| Number of pages | 26 |
| Year | 2001 |
| Document history | |
| Country | USA |
| Keyword | EIA 85;85;EIA JESD85 |