Cart
0
Product
Products
(empty)
No products
To be determined
Shipping
$0.00
Total
Product successfully added to your shopping cart
Quantity
Total
There are 0 items in your cart.
There is 1 item in your cart.
Total products
Total shipping
To be determined
Total
Reduced price!
View larger
View larger
EIA JESD 51-13:2009
New product
EIA JESD 51-13:2009
Glossary of Thermal Measurement Terms and DefinitionsMore info
This document provides a unified collection of the commonly used terms and definitions in the area of semiconductor thermal measurements. The terms and definitions provided herein extend beyond those used in the JESD51 family of documents to include other often used terms and definitions in the area of semiconductor thermal measurements.
| Author | EIA |
|---|---|
| Editor | EIA |
| Document type | Standard |
| Format | File |
| ICS | 01.040.17 : Metrology and measurement. Physical phenomena (Vocabularies)
01.040.31 : Electronics (Vocabularies) 17.200.01 : Thermodynamics in general 31.080.01 : Semiconductor devices in general |
| Number of pages | 14 |
| Year | 2009 |
| Document history | |
| Country | USA |
| Keyword | EIA JESD 51;EIA 51;EIA 51.13;51;EIA JESD51-13 |