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This document was written with the intent to provide information for quality organizations in both semiconductor companies and their customers to assess and make decisions on safe ESD CDM level requirements.
| Author | EIA |
|---|---|
| Editor | EIA |
| Document type | Standard |
| Format | File |
| ICS | 17.220.20 : Measurement of electrical and magnetic quantities
|
| Number of pages | 128 |
| Year | 2009 |
| Document history | |
| Country | USA |
| Keyword | EIA 157;157;EIA JEP157 |