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EIA JESD 51-50:2012

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EIA JESD 51-50:2012

Overview of Methodologies for the Thermal Measurement of Single- and Multi-Chip, Single- and Multi-PN-Junction Light-Emitting Diodes (LEDs)

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The measurement methodology described herein is distributed among several documents so that the appropriate combination of documents can be selected to meet specific thermal measurement requirements. This document provides the OVERVIEW; Each group will have one or more applicable documents to reflect different thermal measurement requirements. Because environmental conditions, component mounting approaches and device construction techniques and processes will change as technology changes, additional documents will be added to these groups as the needs arise and standards established. As appropriate, each of these documents will contain terminology and symbolic definitions that are specific to the material covered by the individual document; this information will also be included in a single document to make for easy access.

Author EIA
Editor EIA
Document type Standard
Format File
ICS 31.260 : Optoelectronics. Laser equipment
Number of pages 12
Year 2012
Document history
Country USA
Keyword EIA JESD 51;EIA 51;EIA 51.50;51;EIA JESD51-50