No products
New product
This procedure is to define a method of detecting a discontinuity of one microsecond or longer in a mated electrical connector, contact or socket. This procedure shall not be used for durations less than one microsecond; see EIA-364-87, Test Procedure for Nanosecond Event Detection.
Author | EIA |
---|---|
Editor | EIA |
Document type | Standard |
Format | File |
ICS | 29.120.20 : Connecting devices
|
Number of pages | 11 |
Replace | EIA-364-46B (2006-01) |
Cross references | ANSI/EIA-364-46C (2012), IDT |
Year | 2012 |
Document history | EIA-364-46C (2012-11) |
Country | USA |
Keyword | EIA 364;EIA 364.46C;EIA-364;364 |