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This test is conducted to determine the resistance of a part to sudden exposure to extreme changes in temperature and to the effect of alternate exposures to these extremes.
| Author | EIA |
|---|---|
| Editor | EIA |
| Document type | Standard |
| Format | File |
| ICS | 31.080.01 : Semiconductor devices in general
|
| Number of pages | 10 |
| Replace | EIA JESD 22-A106B (2004-06) |
| Year | 2016 |
| Document history | EIA JESD 22-A106B.01 (2016-11) |
| Country | USA |
| Keyword | EIA JESD 22;EIA 22;EIA 22.A106B;22;EIA JESD22-A106B.01 |