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EIA JESD 659C:2017
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EIA JESD 659C:2017
Failure-Mechanism-Driven Reliability MonitoringMore info
This method establishes requirements for application of Statistical Reliability Monitoring 'SRM' technology to monitor and improve the reliability of electronic components and subassemblies. The standard also describes the condition under with a monitor may be replaced or eliminated. Formerly known as EIA-659, that superseded JESD29-A (July 1996). Became JESD659 after revision, September 1999.
| Author | EIA |
|---|---|
| Editor | EIA |
| Document type | Standard |
| Format | File |
| ICS | 03.120.30 : Application of statistical methods
31.020 : Electronic components in general |
| Number of pages | 16 |
| Replace | EIA JESD 659B:2007 |
| Year | 2017 |
| Country | USA |
| Keyword | EIA 659B;659B;EIA JESD659B |