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This International Standard gives models and numerical methods for reliability growth assessments based on failure data, which were generated in a reliability improvement programme. These procedures deal with growth, estimation, confidence intervals for product reliability and goodness-of-fit tests.
Author | EIA |
---|---|
Editor | EIA |
Document type | Standard |
Format | File |
ICS | 03.120.01 : Quality in general
29.020 : Electrical engineering in general |
Number of pages | 59 |
Cross references | ANSI/EIA-61164 (2017), IDT |
Year | 2017 |
Document history | |
Country | USA |
Keyword | EIA 61164;61164 |