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This standard is intended to provide a uniform method of determining fraction nonconforming in finished devices and to provide a standardized definition of the quality index referred to as Average Outgoing Quality (AOQ). The method used here is primarily directed at devices whose production or procured volume is large enough, during some predefined sampling period, to give statistically meaningful information.
Author | EIA |
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Editor | EIA |
Document type | Standard |
Format | File |
ICS | 03.120.30 : Application of statistical methods
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Number of pages | 40 |
Replace | EIA JESD 16-A (1995-04) |
Year | 2017 |
Document history | EIA JESD 16B (2017-11) |
Country | USA |
Keyword | EIA 16B;16B;EIA JESD16B |