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This document is intended to aid the operators of X-ray photoelectron spectrometers in their analysis of typical samples. It takes the operator through the analysis from the handling of the sample and the calibration and setting-up of the spectrometer to the acquisition of wide and narrow scans and also gives advice on quantification and on preparation of the final report.
Author | ISO/TC 201/SC 7 Electron spectroscopies |
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Editor | ISO |
Document type | Standard |
Format | Paper |
Edition | 2 |
Number of pages | 32 |
Replace | ISO 10810:2010 |
Weight(kg.) | 0.1544 |
Year | 2019 |
Country | Switzerland |