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This document specifies the test method for the determination of the deviation from a flat image surface, i.e. the sagittal and tangential field curvature of telescopic systems and observational telescopic instruments.
Author | ISO/TC 172/SC 4 Telescopic systems |
---|---|
Editor | ISO |
Document type | Standard |
Format | Paper |
Edition | 1 |
Number of pages | 5 |
Weight(kg.) | 0.1085 |
Year | 2019 |
Country | Switzerland |