No products
New product
This Standard defines profiles and the general structure of contact (stylus) instruments for measuring surface roughness and waviness, enabling existing International Standards to be applied to practical profile evaluation. It specifies the properties of the instrument which influence profile evaluation and it provides the basics of the specification of contact (stylus) instruments (profile meter and profile recorder).
Author | JSA |
---|---|
Editor | JSA |
Document type | Standard |
Format | File |
Confirmation date | 2016-10-20 |
ICS | 17.040.40 : Geometrical Product Specification (GPS)
|
Number of pages | 25 |
Replace | JIS B 0651 (1996-04-01) |
Cross references | ISO 3274 (1996-12), IDT |
Modified by | JIS B 0651/ERRATUM 2 (2002)
JIS B 0651/ERRATUM 1 (2002) JIS B 0651/ERRATUM 1 (2001) |
Year | 2001 |
Document history | JIS B 0651 (2001-01-20) |
Country | Japan |
Keyword | JIS 0651;0651 |