Cart
0
Product
Products
(empty)
No products
To be determined
Shipping
$0.00
Total
Product successfully added to your shopping cart
Quantity
Total
There are 0 items in your cart.
There is 1 item in your cart.
Total products
Total shipping
To be determined
Total
Reduced price!
View larger
View larger
SAE ARP 6338A:2019-02-08
New product
SAE ARP 6338A:2019-02-08
Process for Assessment and Mitigation of Early Wearout of Life-Limited MicrocircuitsMore info
This document is intended for use by designers, reliability engineers, and others associated with the design, production, and support of electronic sub-assemblies, assemblies, and equipment used in AADHP applications to conduct lifetime assessments of microcircuits with the potential for early wearout; and to implement mitigations when required; and by the users of the AADHP equipment to assess those designs and mitigations.
| Author | SAE |
|---|---|
| Editor | SAE |
| Document type | Standard |
| Format | File |
| ICS | 31.080.01 : Semiconductor devices in general
49.060 : Aerospace electric equipment and systems |
| Number of pages | 14 |
| Replace | SAE ARP 6338:2015-12-06 |
| Year | 2019 |
| Document history | SAE ARP 6338:2015-12-06 |
| Country | USA |
| Keyword | SAE 6338;SAE ARP6338A;SAE ARP6338A;SAE ARP 6338 |