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ASTM F1467-18
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ASTM F1467-18
Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and MicrocircuitsMore info
1.1 This guide covers recommended procedures for the use of X-ray testers (that is, sources with a photon spectrum having ≈10 keV mean photon energy and ≈50 keV maximum energy) in testing semiconductor discrete devices and integrated circuits for effects from ionizing radiation.
| Author | ASTM |
|---|---|
| Editor | ASTM |
| Document type | Standard |
| Format | File |
| ICS | 31.020 : Electronic components in general
|
| Number of pages | 18 |
| Replace | ASTM F1467-11 |
| Set | ASTMVOL1004 |
| Year | 2018 |
| Document history | ASTM F1467-11 |
| Country | USA |
| Keyword | ASTM 1467;ASTM F1467;ASTM F1467;10.1520/F1467-18 |