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Description / Abstract:
This Standard recommends and describes methods of measurement of
the important electrical characteristics of semiconductor diodes.
For the purpose of this Standard, a semiconductor diode is defined1
as:
"A semiconductor device having two terminals and exhibiting a nonlinear voltage—current characteristic; in more restricted usage, a semiconductor device which has the asymmetrical voltage—current characteristic exemplified by a single p-n junction."
Methods of test are described for static, small-signal and pulse parameters.
Many of the terms considered herein have been set down in AI E E and IRE Standards, particularly in 60 IRE 28.SH and AI EE No. 4252
"A semiconductor device having two terminals and exhibiting a nonlinear voltage—current characteristic; in more restricted usage, a semiconductor device which has the asymmetrical voltage—current characteristic exemplified by a single p-n junction."
Methods of test are described for static, small-signal and pulse parameters.
Many of the terms considered herein have been set down in AI E E and IRE Standards, particularly in 60 IRE 28.SH and AI EE No. 4252