JEDEC JESD47I

Reference: M00003788

Condition: New product

JEDEC JESD47I STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS

standard by JEDEC Solid State Technology Association, 04/01/2011

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This standard describes a baseline set of acceptance tests for use in qualifying electronic components as new products, a product family, or as products in a process which is being changed.

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Published: 04/01/2011 Number of Pages: 28File Size: 1 file , 260 KB