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JEDEC JESD51-50

M00003778

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JEDEC JESD51-50 Overview of Methodologies for the Thermal Measurement of Single- and Multi-Chip, Single- and Multi-PN-Junction Light-Emotting Diodes (LEDs)

standard by JEDEC Solid State Technology Association, 04/18/2012

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This document provides an overview of the methodology necessary for making meaningful thermal measurements on high-power light-emitting diodes (LEDs) built on single or multiple chips with one or more pn-junctions per chip. The actual methodology components are contained in separate detailed documents.

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Published: 04/18/2012 Number of Pages: 12File Size: 1 file , 73 KB