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JEDEC JESD22-A108D TEMPERATURE, BIAS, AND OPERATING LIFE standard by JEDEC Solid State Technology Association, 11/01/2010
JEDEC JESD51-14 INTERFACE TEST METHOD FOR THE MEASUREMENT OF THE THERMAL RESISTANCE JUNCTION-TO-CASE OF SEMICONDUCTOR DEVICES WITH HEAT FLOW TROUGH A SINGLE PATH standard by JEDEC Solid State Technology Association, 11/01/2010
JEDEC JESD22-A110D HIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST) standard by JEDEC Solid State Technology Association, 11/01/2010
JEDEC JEP 122F FAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICES standard by JEDEC Solid State Technology Association, 11/01/2010
JEDEC JESD31D GENERAL REQUIREMENTS FOR DISTRIBUTORS OF COMMERCIAL AND MILITARY SEMICONDUCTOR DEVICES standard by JEDEC Solid State Technology Association, 09/01/2010
JEDEC JESD217 TEST METHODS TO CHARACTERIZE VOIDING IN PRE-SMT BALL GRID ARRAY PACKAGES standard by JEDEC Solid State Technology Association, 09/01/2010
JEDEC JESD 78C IC LATCH-UP TEST standard by JEDEC Solid State Technology Association, 09/01/2010
JEDEC JESD 219 SOLID STATE DRIVE (SSD) ENDURANCE WORKLOADS standard by JEDEC Solid State Technology Association, 09/01/2010
JEDEC JESD 218 SOLID STATE DRIVE (SSD) REQUIREMENTS AND ENDURANCE TEST METHOD standard by JEDEC Solid State Technology Association, 09/01/2010
JEDEC JESD22-B108B COPLANARITY TEST FOR SURFACE-MOUNT SEMICONDUCTOR DEVICES standard by JEDEC Solid State Technology Association, 09/01/2010
JEDEC JEP159 PROCEDURE FOR THE EVQLUQTION OF LOW-k/METAL INTER/INTRA-LEVEL DIELECTRIC INTEGRITY standard by JEDEC Solid State Technology Association, 08/01/2010
JEDEC JESD22-B115A SOLDER BALL PULL standard by JEDEC Solid State Technology Association, 08/01/2010