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EIA-364-29D:2019 TP-29D Contact Retention Test Procedure for Electrical Connectors
EIA-364-20F:2019 TP-20F Dielectric Withstanding Voltage Test Procedure for Electrical Connectors, Sockets and Coaxial Contacts
EIA JEP 143D:2019 Solid-State Reliability Assessment and Qualification Methodologies
EIA-364-31F:2019 TP-31F Humidity Test Procedure for Electrical Connectors and Sockets
EIA-364-119:2019 TP-119 Removal Tool Rotation Test Procedure for Electrical Connectors
EIA/TIA-568.2-D:2018 Balanced Twisted-Pair Telecommunications Cabling and Components Standard
EIA/TIA-470.140:2018 Telecommunications Telephone Terminal Equipment Analog Telephone Acoustic Echo Canceller Test Methods and Performance Requirements
EIA JEP 001-3A:2018 FOUNDRY PROCESS QUALIFICATION GUIDELINES - PRODUCT LEVEL (Wafer Fabrication Manufacturing Sites)
EIA JEP 001-2A:2018 FOUNDRY PROCESS QUALIFICATION GUIDELINES - FRONT END TRANSISTOR LEVEL (Wafer Fabrication Manufacturing Sites)
EIA JEP 001-1A:2018 FOUNDRY PROCESS QUALIFICATION GUIDELINES - BACKEND OF LINE (Wafer Fabrication Manufacturing Sites)
EIA JESD 22-B112B:2018 Package Warpage Measurement of Surface-Mount Integrated Circuits at Elevated Temperature
EIA JEP 132A:2018 Process Characterization Guideline