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EIA-512-1:1990 Standard Methods for Measurement of the Equivalent Electrical Parameters of Quartz Crystal Units, 1 kHz to 1 GHz
EIA JESD 24-3:1990 (R2002) Thermal Impedance Measurements for Vertical Power MOSFETs (Delta Source-Drain Voltage Method)
EIA/TIA-455-48-B:1990 (R2014) FOTP-48 Measurement of Optical Fiber Cladding Diameter Using Laser-Based Instructions
EIA-520EAAC:1990 Detail Specification for Dual In-Line Switches of Certified Quality
EIA-448-22:1990 Resistance to Soldering Heat, Soldering Method
EIA-403-A:1990 Precision Coaxial Connectors for CATV Application (75 Ohms)
EIA-540BAAB:1990 Detail Specification for Non-Mechanically Actuated Sockets for Pin Grid Array Devices with 2.54 mm X 2.54 mm (0.1' X 0.1') Spacing for Use in Electronic Equipment R(1997)
EIA-520EAAD:1990 Detail Specification for Dual-In-Line Package (DIP) Switches, Raised and Recessed Slide Actuated
EIA/TIA-574:1990 (R2012) 9-Position Non-Synchronous Interface Between Data Terminal Equipment and Data Circuit-Terminating Equipment Employing Serial Binary Data Interchange
EIA-477-A:1990 Cultured Quartz (Inclusion of 477-1-A)
EIA/TIA/IS-63:1990 Procedures for Automatic Interworking Between Automode Modems and Modems Conforming to Recommendations V.32, V.22bis, and V.22
EIA JESD 24-5:1990 (R2002) Single Pulse Unclamped Inductive Switching (UIS) Avalanche Test Method