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EIA JESD 76-2:2001
EIA JESD 76-2:2001 Standard Description of 1.2 V CMOS Logic Devices (Normal Range Operations)
$14.71 $33.44 -56%Reduced price!In Stock -
EIA-540J0AB:2001
EIA-540J0AB:2001 Detail Specification for Coin Cell Battery Holders for Use in Electronic Equipment
$34.06 $77.40 -56%Reduced price!In Stock -
EIA-364-68A:2001 (R2008)
EIA-364-68A:2001 (R2008) TP-68A Actuating Mechanism Test Procedure for Electrical Connectors
$28.51 $64.80 -56%Reduced price!In Stock -
EIA-364-19A:2001 (R2008)
EIA-364-19A:2001 (R2008) TP-19A Torsional Insert Retention Test Procedure for Electrical Connectors
$28.51 $64.80 -56%Reduced price!In Stock -
EIA JESD 35-A:2001
EIA JESD 35-A:2001 Procedure for the Wafer-Level Testing of Thin Dielectrics
$25.94 $58.96 -56%Reduced price!In Stock -
EIA-364-47A:2001 (R2008)
EIA-364-47A:2001 (R2008) Conductor Unwrap (Solderless Wrapped Connection) Test Procedure for Electrical Connectors
$28.51 $64.80 -56%Reduced price!In Stock -
EIA TSB 100-A:2001
EIA TSB 100-A:2001 Wireless Network Reference Model
$94.09 $213.84 -56%Reduced price!In Stock -
EIA/TIA-455-58-B:2001
EIA/TIA-455-58-B:2001 FOTP-58 Core Diameter Measurement of Graded-Index Optical Fibers
$34.07 $77.44 -56%Reduced price!In Stock -
EIA/TIA-644-A:2001 (R2012)
EIA/TIA-644-A:2001 (R2012) Electrical Characteristics of Low Voltage Differential Signaling (LVDS) Interface Circuits
$34.78 $79.05 -56%Reduced price!In Stock -
EIA JEP 139:2000 (R2012)
EIA JEP 139:2000 (R2012) Constant Temperature Aging to Characterize Aluminum Interconnect Metallization for Stress-Induced Voiding
$18.20 $41.36 -56%Reduced price!In Stock -
EIA TSB 115:2000
EIA TSB 115:2000 cdma2000 Wireless IP Architecture Based on IETF Protocols
$44.92 $102.08 -56%Reduced price!In Stock -
EIA-448-21A:2000
EIA-448-21A:2000 Test Standard for Electromechanical Components - Environmental Effects of Machine Soldering Using an Infrared System
$29.43 $66.88 -56%Reduced price!In Stock
